Lattice reorientation in tetragonal PMN-PT thin film induced by focused ion beam preparation for transmission electron microscopy
Thibaud Denneulin,, Wanjoo Maeng,, Chang-Beom Eom,, and Martin HÿtchLattice reorientation tetragonal PMN-PT
| Document type | Article |
| Journal title / Source | Journal of Applied Physics 121, 055302 (2017); doi: 10.1063/1.4975114 |
| Peer-reviewed article | 1 |
| Volume | 121, 055302 (2017); |
| Issue | 121, 055302 (2017); |
| Page numbers / Article number | not provided in pdf |
| Publisher's name | American Institute of Physics |
| Publisher's address (city only) | Not provided |
| Publication date | 2017-2 |
| ISSN | 055302 |
| DOI | 10.1063/1.4975114 |
| Web URL | http://aip.scitation.org/doi/abs/10.1063/1.4975114 |
| Language | English |