Lattice reorientation in tetragonal PMN-PT thin film induced by focused ion beam preparation for transmission electron microscopy
Thibaud Denneulin,, Wanjoo Maeng,, Chang-Beom Eom,, and Martin HÿtchLattice reorientation tetragonal PMN-PT
Document type | Article |
Journal title / Source | Journal of Applied Physics 121, 055302 (2017); doi: 10.1063/1.4975114 |
Peer-reviewed article | 1 |
Volume | 121, 055302 (2017); |
Issue | 121, 055302 (2017); |
Page numbers / Article number | not provided in pdf |
Publisher's name | American Institute of Physics |
Publisher's address (city only) | Not provided |
Publication date | 2017-2 |
ISSN | 055302 |
DOI | 10.1063/1.4975114 |
Web URL | http://aip.scitation.org/doi/abs/10.1063/1.4975114 |
Language | English |