Digital Multimeters Voltage Sampling Performance Comparison
Lapuh R., Kučera J., Kováč J., Palafox L., Voljč B.Apertures; Signal to noise ratio;1/f noise; Signal resolution; Voltage measurement; Time-frequency analysis; Noise measurement; Metrology; Accuracy; Time measurement ;Amplitude response ;harmonics; Josephson voltage source; measurement; measurement uncertainty; phase response; sampling
| Document type | Article |
| Journal title / Source | IEEE Transactions on Instrumentation and Measurement |
| Volume | 75 |
| Page numbers / Article number | 1-11 |
| Publisher's name | Institute of Electrical and Electronics Engineers (IEEE) |
| Publisher's address (city only) | Piscataway, NJ, United States |
| Publication date | 2026-1-1 |
| ISSN | 0018-9456,1557-9662 |
| DOI | 10.1109/TIM.2026.3670543 |