Evaluation of X-ray fluorescence for analysing critical elements in three electronic waste matrices: A comprehensive comparison of analytical techniques
Lancaster S.T., Sahlin E., Oelze M., Ostermann M., Vogl J., Laperche V., Touze S., Ghestem J.P, Dalencourt C., Gendre R., Stammeier J., Klein O., Pröfrock D., Košarac G., Jotanovic A., Bergamaschi L., Di Luzio M., D’Agostino G., Jaćimović R., Eberhard M., Feiner L., Trimmel S., Rachetti A., Sara-Aho T., Roethke A., Michaliszyn L., Pramann A., Rienitz O., Irrgeher J.XRF, WEEE, PCB, Battery, LED, Recycling
| Document type | Article |
| Journal title / Source | Waste Management |
| Volume | 190 |
| Page numbers / Article number | 496-505 |
| Publisher's name | Elsevier BV |
| Publisher's address (city only) | Amsterdam, NX, Netherlands |
| Publication date | 2024-10-19 |
| ISSN | 0956-053X |
| DOI | 10.1016/j.wasman.2024.10.015 |
| Language | English |