Bright single-photon emission from a GeV center in diamond under a microfabricated solid immersion lens at room temperature
Kück S., Forneris J., Dunatov T., Jakšić M., Etzkorn M., Liu Z., Hofer H., Christinck J., Hirt F.Time-correlated single photon counting, Focused ion beam, Crystallographic defects, Diamond, Solid immersion lens, Scanning electron microscopy
| Document type | Article |
| Journal title / Source | Journal of Applied Physics |
| Volume | 133 |
| Issue | 19 |
| Page numbers / Article number | 193102 |
| Publisher's name | AIP Publishing |
| Publisher's address (city only) | Melville, NY, United States |
| Publication date | 2023-5-16 |
| ISSN | 0021-8979, 1089-7550 |
| DOI | 10.1063/5.0150208 |
| Web URL | https://pubs.aip.org/aip/jap/article/133/19/193102/2890950/Bright-single-photon-emission-from-a-GeV-center-in |
| Language | English |