Signal Amplification Gains of Compressive Sampling for Photocurrent Response Mapping of Optoelectronic Devices
Koutsourakis G. , Blakesley J.C., Castro F.A.non-destructive testing, current mapping, digital micromirror device, compressed sensing
Document type | Article |
Journal title / Source | Sensors |
Volume | 19 |
Issue | 13 |
Page numbers / Article number | 2870 |
Publisher's name | MDPI AG |
Publication date | 2019-6-28 |
ISSN | 1424-8220 |
DOI | 10.3390/s19132870 |
Language | English |