Signal Amplification Gains of Compressive Sampling for Photocurrent Response Mapping of Optoelectronic Devices
Koutsourakis G. , Blakesley J.C., Castro F.A.non-destructive testing, current mapping, digital micromirror device, compressed sensing
| Document type | Article |
| Journal title / Source | Sensors |
| Volume | 19 |
| Issue | 13 |
| Page numbers / Article number | 2870 |
| Publisher's name | MDPI AG |
| Publication date | 2019-6-28 |
| ISSN | 1424-8220 |
| DOI | 10.3390/s19132870 |
| Language | English |