Signal Amplification Gains of Compressive Sampling for Photocurrent Response Mapping of Optoelectronic Devices

Koutsourakis G. , Blakesley J.C., Castro F.A.
Keywords:

non-destructive testing, current mapping, digital micromirror device, compressed sensing

Document type Article
Journal title / Source Sensors
Volume 19
Issue 13
Page numbers / Article number 2870
Publisher's name MDPI AG
Publication date 2019-6-28
ISSN 1424-8220
DOI 10.3390/s19132870
Language English

Back to the list view