Internal quantum efficiency of silicon photodetectors at ultraviolet wavelengths
Korpusenko M., Vaskuri A., Manoocheri F., Ikonen E.PQED, ultraviolet responsivity, si photodiodes, Hamamatsu trap, charge-carrier recombination losses
| Document type | Article |
| Journal title / Source | Metrologia |
| Volume | 60 |
| Issue | 5 |
| Page numbers / Article number | 055010 |
| Publisher's name | IOP Publishing |
| Publisher's address (city only) | Bristol, United Kingdom |
| Publication date | 2023-9-14 |
| ISSN | 0026-1394, 1681-7575 |
| DOI | 10.1088/1681-7575/acf5f0 |
| Web URL | https://iopscience.iop.org/article/10.1088/1681-7575/acf5f0/pdf |
| Language | English |