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Tip wear and tip breakage in high-speed atomic force microscopes

Strahlendorff, T., Dai, G., Bergmann, D. and Tutsch, R.
Keywords:

Atomic force microscopy (AFM), High-speed AFM, Tip wear, Tip breakage, Tip characterization, Tip-sample interaction

Document typeArticle
Journal title / SourceUltramicroscopy
Volume201
Page numbers / Article number28-37
Publisher's nameElsevier BV
Publication date 2019-06
ISSN0304-3991
DOI10.1016/j.ultramic.2019.03.013
LanguageEnglish

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