Tip wear and tip breakage in high-speed atomic force microscopes

Korpelainen V., Strahlendorff T., Dai G., Bergmann D., Tutsch R.

Atomic force microscopy (AFM), High-speed AFM, Tip wear, Tip breakage, Tip characterization, Tip-sample interaction

Document type Article
Journal title / Source Ultramicroscopy
Volume 201
Page numbers / Article number 28-37
Publisher's name Elsevier BV
Publication date 2019-6
ISSN 0304-3991
DOI 10.1016/j.ultramic.2019.03.013
Language English

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