Tip wear and tip breakage in high-speed atomic force microscopes
Korpelainen V., Strahlendorff T., Dai G., Bergmann D., Tutsch R.Atomic force microscopy (AFM), High-speed AFM, Tip wear, Tip breakage, Tip characterization, Tip-sample interaction
| Document type | Article |
| Journal title / Source | Ultramicroscopy |
| Volume | 201 |
| Page numbers / Article number | 28-37 |
| Publisher's name | Elsevier BV |
| Publication date | 2019-6 |
| ISSN | 0304-3991 |
| DOI | 10.1016/j.ultramic.2019.03.013 |
| Language | English |