Interlaboratory Comparison of Commercial High-Resistivity Silicon Calibration Substrate at D-Band
Koo H., Ngoc Phung G., Arz U., Cho C., Kwon J.Calibration, Coplanar Waveguide (CPW), D-band, on-wafer measurement, probe effects, S-parameters
| Document type | Article |
| Journal title / Source | IEEE Microwave and Wireless Technology Letters |
| Volume | 35 |
| Issue | 12 |
| Page numbers / Article number | 2129-2132 |
| Publisher's name | Institute of Electrical and Electronics Engineers (IEEE) |
| Publisher's address (city only) | Piscataway, NJ, United States |
| Publication date | 2025-1-1 |
| ISSN | 2771-9588,2771-957X |
| DOI | 10.1109/LMWT.2025.3625538 |