Stitching accuracy in large area Scanning Probe Microscopy
Klapetek P., Nečas D., Heaps E., SAUVET B., Klapetek V., Valtr M., Korpelainen V., Yacoot A.Image stitching, Scanning Probe Microscope (SPM). large areas SPM, high-speed SPM. SPM error sources
| Document type | Article |
| Journal title / Source | Measurement Science and Technology |
| Publisher's name | IOP Publishing |
| Publisher's address (city only) | Bristol, United Kingdom |
| Publication date | 2024-9-12 |
| ISSN | 0957-0233, 1361-6501 |
| DOI | 10.1088/1361-6501/ad7a13 |
| Language | English |