Scanning Probe Microscopy controller with advanced sampling support

Klapetek P., Martinek J., Novotný O., Jelínek Z., Hortvík V., Nečas D., Valtr M.
Keywords:

Scanning probe microscopy; Adaptive sampling; Field programmable gate array

Document type Article
Journal title / Source HardwareX
Volume 15
Page numbers / Article number e00451
Publisher's name Elsevier BV
Publisher's address (city only) Amsterdam, NX, Netherlands
Publication date 2023-9
ISSN 2468-0672
DOI 10.1016/j.ohx.2023.e00451
Web URL https://www.sciencedirect.com/science/article/pii/S2468067223000585?via%3Dihub
Language English

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