Scanning Probe Microscopy controller with advanced sampling support
Klapetek P., Martinek J., Novotný O., Jelínek Z., Hortvík V., Nečas D., Valtr M.Scanning probe microscopy; Adaptive sampling; Field programmable gate array
Document type | Article |
Journal title / Source | HardwareX |
Volume | 15 |
Page numbers / Article number | e00451 |
Publisher's name | Elsevier BV |
Publisher's address (city only) | Amsterdam, NX, Netherlands |
Publication date | 2023-9 |
ISSN | 2468-0672 |
DOI | 10.1016/j.ohx.2023.e00451 |
Web URL | https://www.sciencedirect.com/science/article/pii/S2468067223000585?via%3Dihub |
Language | English |