Analytical Uncertainty Evaluation of Material Parameter Measurements at THz Frequencies
Kazemipour A., Wollensack M., Hoffmann J., Hudlicka M., Yee S-K., Rüfenacht J., Stalder D., Gäumann G., Zeier M.Material characterization, Extraction method, THz domain, Sensitivity coefficient, Measurement uncertainty, RF metrology
| Document type | Article |
| Journal title / Source | Journal of Infrared, Millimeter, and Terahertz Waves |
| Volume | 41 |
| Issue | 10 |
| Page numbers / Article number | 1199 - 1217 |
| Publisher's name | Springer Science and Business Media LLC |
| Publication date | 2020-7-24 |
| ISSN | 1866-6892, 1866-6906 |
| DOI | 10.1007/s10762-020-00723-0 |
| Language | English |