Nanoform evaluation approach using Mueller matrix microscopy and machine learning concepts

Käseberg T., Grundmann J., Kroker S., Bodermann B.

Mueller matrix microscopy, machine learning

Document type Proceedings
Journal title / Source EPJ Web of Conferences
Volume 266
Page numbers / Article number 10007
Publisher's name EDP Sciences
Publication date 2022-10-13
Conference name European Optical Society Annual Meeting 2022
Conference date 12-09-2022 to 16-09-2022
Conference place Porto
ISSN 2100-014X
DOI 10.1051/epjconf/202226610007
Language English

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