Nanoform evaluation approach using Mueller matrix microscopy and machine learning concepts
Käseberg T., Grundmann J., Kroker S., Bodermann B.Mueller matrix microscopy, machine learning
| Document type | Proceedings |
| Journal title / Source | EPJ Web of Conferences |
| Volume | 266 |
| Page numbers / Article number | 10007 |
| Publisher's name | EDP Sciences |
| Publication date | 2022-10-13 |
| Conference name | European Optical Society Annual Meeting 2022 |
| Conference date | 12-09-2022 to 16-09-2022 |
| Conference place | Porto |
| ISSN | 2100-014X |
| DOI | 10.1051/epjconf/202226610007 |
| Language | English |