Nanoform evaluation approach using Mueller matrix microscopy and machine learning concepts
Käseberg T., Grundmann J., Kroker S., Bodermann B.Mueller matrix microscopy, machine learning
Document type | Proceedings |
Journal title / Source | EPJ Web of Conferences |
Volume | 266 |
Page numbers / Article number | 10007 |
Publisher's name | EDP Sciences |
Publication date | 2022-10-13 |
Conference name | European Optical Society Annual Meeting 2022 |
Conference date | 12-09-2022 to 16-09-2022 |
Conference place | Porto |
ISSN | 2100-014X |
DOI | 10.1051/epjconf/202226610007 |
Language | English |