Mason’s Gain of Down-Scaled InP HBTs with Two Setups: Effects of Probes and Frequency Extenders
Kanitkar A., Doerner R., Johansen T., Heinrich W., Flisgen T.InP HBTs, mTRL calibration, On-wafer measurements, transistor characterization
| Document type | Proceedings |
| Journal title / Source | 2026 17th German Microwave Conference (GeMiC) |
| Page numbers / Article number | 141-144 |
| Publisher's name | IEEE |
| Publisher's address (city only) | Piscataway, NJ, United States |
| Publication date | 2026-1-1 |
| Conference name | 17th German Microwave Conference (GeMiC) |
| Conference date | 09-11 March 2026 |
| Conference place | Karlsruhe, Germany |
| ISSN | 2167-8022 |
| DOI | 10.1109/GeMiC71240.2026.11516367 |