On-Wafer 16-Term Calibration for Characterization of InP HBTs Featuring Sub-THz fmax
Kanitkar A., Doerner R., Johansen T., Heinrich W., Flisgen T.InP HBTs, On-wafer measurements, Transistor characterization, 8-term calibration, 16-term calibration
| Document type | Proceedings |
| Journal title / Source | |
| Page numbers / Article number | 687-690 |
| Publisher's name | IEEE |
| Publisher's address (city only) | Piscataway, NJ, United States |
| Publication date | 2025-1-1 |
| Conference name | 2025 55th European Microwave Conference (EuMC) |
| Conference date | 23-25 September 2025 |
| Conference place | Utrecht, Netherlands |
| DOI | 10.23919/EuMC65286.2025.11235132 |