Influence of On-Wafer Parasitic Effects on Mason’s Gain of Down-Scaled InP HBTs
Kanitkar A., Doerner R., Johansen T.K., Heinrich W., Flisgen T.InP HBT, Mason’s gain determination, On-wafer parasitic effects, 8-term error model
| Document type | Proceedings |
| Journal title / Source | 2024 54th European Microwave Conference (EuMC) |
| Page numbers / Article number | 252-255 |
| Publisher's name | IEEE |
| Publisher's address (city only) | Piscataway |
| Publication date | 2024-10-31 |
| Conference name | 2024 54th European Microwave Conference |
| Conference date | 24-09-2024 to 26-09-2024 |
| Conference place | Paris, France |
| DOI | 10.5281/zenodo.14960427 |
| ISBN | 978-2-87487-077-4 |
| Web URL | https://ieeexplore.ieee.org/document/10732142 |
| Language | English |