DATASET 3D Imaging and Quantitative Subsurface Dielectric Constant Measurement Using Peak Force Kelvin Probe Force Microscopy
Kaja K., Assoum A., Piquemal F., De Wolf P., Nehmee A., Naja A., Jouiad M., Beyrouthy T.AFM, data clustering, dielectric constant, KPFM, nano tomography, peak force tapping, subsurface
| Document type | Datasets |
| Journal title / Source | Advanced Materials Interfaces |
| Volume | 2300503 |
| Page numbers / Article number | 1-10 |
| Publisher's name | Wiley-VCH |
| Publication date | 2023 |
| Language | English |
| Persistent Identifier | 10.5281/zenodo.8402491 |