3D Imaging and Quantitative Subsurface Dielectric Constant Measurement Using Peak Force Kelvin Probe Force Microscopy
Kaja K., Assoum A., De Wolf P., Piquemal F., Nehmee A., Naja A., Beyrouthy T., Jouiad M.Kelvin Probe Force Microscopy Dielectric constant Nanoscale
| Document type | Article |
| Journal title / Source | Advanced Materials Interfaces |
| Volume | 2300503 |
| Page numbers / Article number | 1-10 |
| Publisher's name | Wiley |
| Publisher's address (city only) | Hoboken, NJ, United States |
| Publication date | 2023-11 |
| ISSN | 2196-7350, 2196-7350 |
| DOI | 10.1002/admi.202300503 |
| Language | English |