3D Imaging and Quantitative Subsurface Dielectric Constant Measurement Using Peak Force Kelvin Probe Force Microscopy

Kaja K., Assoum A., De Wolf P., Piquemal F., Nehmee A., Naja A., Beyrouthy T., Jouiad M.

Kelvin Probe Force Microscopy Dielectric constant Nanoscale

Document type Article
Journal title / Source Advanced Materials Interfaces
Volume 2300503
Page numbers / Article number 1-10
Publisher's name Wiley
Publisher's address (city only) Hoboken, NJ, United States
Publication date 2023-11
ISSN 2196-7350, 2196-7350
DOI 10.1002/admi.202300503
Language English

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