A Modified Wheatstone Bridge for High-Precision Characterization of Resistor Nonlinearity
Janásek V., Lapuh R., Palafox L., Beev N., Voljč B.Resistors;Bridges;Modeling;Measurement;Harmonic distortion;Voltage;Uncertainty;Distortion;Frequency;Harmonic analysis;Harmonic distortion;measurement uncertainty;polynomial model;precision measurements;resistor nonlinearity;Wheatstone bridge
| Document type | Article |
| Journal title / Source | IEEE Transactions on Instrumentation and Measurement |
| Volume | 75 |
| Page numbers / Article number | 1502709-1502709 |
| Publisher's name | Institute of Electrical and Electronics Engineers (IEEE) |
| Publisher's address (city only) | Piscataway, NJ, United States |
| Publication date | 2026-1-1 |
| ISSN | 0018-9456,1557-9662 |
| DOI | 10.1109/TIM.2026.3699715 |