Ion beam analysis of Cu(In,Ga)Se2 thin film solar cells

Karydas AGK, Streeck CS, Bogdanovic Radovic IBR, Kaufmann CK, Rissom TR, Beckhoff BB, Jakšic MJ, Barradas NPB

Thin solar Cu(In,Ga)Se2 cells, Ion beam analysis, RBS/PIXE techniques, Synchrotron GIXRF analysis, Depth profiling

Document type Article
Journal title / Source Applied Surface Science
Peer-reviewed article 1
Volume 356
Page numbers / Article number 631–638
Publisher's name Elsevier
Publication date 2015-11-30
ISSN 0169-4332
DOI 10.1016/j.apsusc.2015.08.133
Language English

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