Ion beam analysis of Cu(In,Ga)Se2 thin film solar cells
Karydas AGK, Streeck CS, Bogdanovic Radovic IBR, Kaufmann CK, Rissom TR, Beckhoff BB, Jakšic MJ, Barradas NPBThin solar Cu(In,Ga)Se2 cells, Ion beam analysis, RBS/PIXE techniques, Synchrotron GIXRF analysis, Depth profiling
| Document type | Article |
| Journal title / Source | Applied Surface Science |
| Peer-reviewed article | 1 |
| Volume | 356 |
| Page numbers / Article number | 631–638 |
| Publisher's name | Elsevier |
| Publication date | 2015-11-30 |
| ISSN | 0169-4332 |
| DOI | 10.1016/j.apsusc.2015.08.133 |
| Web URL | http://ac.els-cdn.com/S0169433215019467/1-s2.0-S0169433215019467-main.pdf?_tid=cba9d288-1c21-11e6-9bf0-00000aab0f26&acdnat=1463484395_b9279df87868924a41b103cfe0aeacf7 |
| Language | English |