Investigation of Verification Artifacts in WR-03 Waveguides
Shoaib N., Kuhlmann K., Judaschke R., Sellone M., Brunetti L.Scattering parameters, Waveguide standards, Measurement uncertainty, Verification artifacts, Microwave measurements
| Document type | Article |
| Journal title / Source | Journal of Infrared, Millimeter, and Terahertz Waves |
| Peer-reviewed article | 1 |
| Volume | 36 |
| Issue | 11 |
| Page numbers / Article number | 1089-1100 |
| Publisher's name | Springer |
| Publisher's address (city only) | New York |
| Publication date | 2015-8-15 |
| ISSN | 1866-6906 |
| DOI | 10.1007/s10762-015-0193-1 |
| Language | English |