Investigation of Verification Artifacts in WR-03 Waveguides

Shoaib N., Kuhlmann K., Judaschke R., Sellone M., Brunetti L.
Keywords:

Scattering parameters, Waveguide standards, Measurement uncertainty, Verification artifacts, Microwave measurements

Document type Article
Journal title / Source Journal of Infrared, Millimeter, and Terahertz Waves
Peer-reviewed article 1
Volume 36
Issue 11
Page numbers / Article number 1089-1100
Publisher's name Springer
Publisher's address (city only) New York
Publication date 2015-8-15
ISSN 1866-6906
DOI 10.1007/s10762-015-0193-1
Language English

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