Investigation of Verification Artifacts in WR-03 Waveguides
Shoaib N., Kuhlmann K., Judaschke R., Sellone M., Brunetti L.Scattering parameters, Waveguide standards, Measurement uncertainty, Verification artifacts, Microwave measurements
Document type | Article |
Journal title / Source | Journal of Infrared, Millimeter, and Terahertz Waves |
Peer-reviewed article | 1 |
Volume | 36 |
Issue | 11 |
Page numbers / Article number | 1089-1100 |
Publisher's name | Springer |
Publisher's address (city only) | New York |
Publication date | 2015-8-15 |
ISSN | 1866-6906 |
DOI | 10.1007/s10762-015-0193-1 |
Language | English |