Investigation of CVD graphene topography and surface electrical properties

Wang R, Pearce R, Gallop J, Patel T, Zhao F, Pollard A, Klein N, Jackman R, Zurutuza A, Hao L
Keywords:

graphene, Raman spectroscopy, Metrology, scanning probe microscopy techniques

Document type Article
Journal title / Source Surface Topography: Metrology and Properties
Peer-reviewed article 1
Volume 4
Issue 2
Page numbers / Article number 025001
Publisher's name IOP Publishing
Publisher's address (city only) Bristol
Publication date 2016-2-29
ISSN n/a
DOI 10.1088/2051-672X/4/2/025001
Web URL http://iopscience.iop.org/article/10.1088/2051-672X/4/2/025001/pdf
Language English

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