Investigating the Intrinsic Noise Limit of Dayem Bridge NanoSQUIDs
Patel T, Li B, Gallop J, Cox D, Kirby K, Romans E, Chen J, Nisbet A, Hao LSQUIDs, Noise, Junctions, Critical current density (superconductivity), Nanoscale devices, Preamplifiers, Niobium
| Document type | Article |
| Journal title / Source | IEEE Transactions on Applied Superconductivity |
| Peer-reviewed article | 1 |
| Volume | 25 |
| Issue | 3 |
| Page numbers / Article number | 1602105 |
| Publisher's name | IEEE |
| Publisher's address (city only) | Melville |
| Publication date | 2014-10-24 |
| ISSN | 1051-8223 |
| DOI | 10.1109/TASC.2014.2364920 |
| Web URL | http://ieeexplore.ieee.org/document/6936295/?reload=true&arnumber=6936295 |
| Language | English |