Investigating Connection Repeatability of Waveguide Devices at Frequencies from 750 GHz to 1.1 THz
Ridler N. M., Clarke R. G.Measurement repeatability, Measurement standards, VNA calibration, Submillimeter-wave measurements, Measurement uncertainty
| Document type | Proceedings |
| Journal title / Source | 82nd ARFTG Microwave Measurement Conference |
| Peer-reviewed article | 1 |
| Volume | N/A |
| Issue | N/A |
| Page numbers / Article number | N/A |
| Publisher's name | Institute of Electrical and Electronics Engineers (IEEE) |
| Publisher's address (city only) | New York, USA |
| Publication date | 2013-11-18 |
| Conference name | 82nd ARFTG Microwave Measurement Conference |
| Conference date | 18-11-2013 to 21-11-2013 |
| Conference place | Columbus, Ohio, USA |
| ISSN | N/A |
| DOI | 10.1109/ARFTG-2.2013.6737350 |
| ISBN | N/A |
| Web URL | http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=6737350 |
| Language | English |