Improvements to the volume measurement of 28Si spheres to determine the Avogadro constant
Kuramoto N.K., Azuma Y. A, Inaba H. I., Hong F-L. H., Fujii K. FAvogadro constant, diameter measurement, optical interferometer, silicon crystal, spectroscopic ellipsometer, volume measurement.
Document type | Article |
Journal title / Source | IEEE Transaction on Instrumentation and Measurement |
Peer-reviewed article | 1 |
Volume | 64 |
Issue | 6 |
Page numbers / Article number | 1650-1656 |
Publisher's name | Institution of Electrical and Electrical Engineering (IEEE) |
Publisher's address (city only) | Piscataway |
Publication date | 2015-3-19 |
ISSN | 0018-9456 |
DOI | 10.1109/TIM.2015.2401212 |
Web URL | http://ieeexplore.ieee.org/xpl/abstractCitations.jsp?arnumber=7063918&refinements%3D4294557292%26filter%3DAND%28p_IS_Number%3A7104190%29 |
Language | English |
Persistent Identifier | INSPEC 15111473 |