Impact of Microwave Measurement Uncertainty on the Nonlinear Embedding Procedure
Bosi G., Raffo A., Avolio G., Schreurs D., Humphreys D. A.Microwave measurements uncertainty, microwave transistors, nonlinear embedding, power amplifiers, vector-calibrated nonlinear measurements.
| Document type | Proceedings |
| Journal title / Source | N/A |
| Peer-reviewed article | 1 |
| Volume | N/A |
| Issue | N/A |
| Page numbers / Article number | 1-4 |
| Publisher's name | IEEE |
| Publisher's address (city only) | Piscataway |
| Publication date | 2016-5-27 |
| Conference name | 87th ARFTG Microwave Measurement Conference |
| Conference date | 27-05-2016 |
| Conference place | San Francisco, CA, USA |
| ISSN | N/A |
| ISBN | 978-1-5090-1308-1 |
| Web URL | http://www.arftg.org/ |
| Language | English |
| Persistent Identifier | IEEE Catalog Number: CFP16ARF-ART |