Impact of Microwave Measurement Uncertainty on the Nonlinear Embedding Procedure
Bosi G., Raffo A., Avolio G., Schreurs D., Humphreys D. A.Microwave measurements uncertainty, microwave transistors, nonlinear embedding, power amplifiers, vector-calibrated nonlinear measurements.
Document type | Proceedings |
Journal title / Source | N/A |
Peer-reviewed article | 1 |
Volume | N/A |
Issue | N/A |
Page numbers / Article number | 1-4 |
Publisher's name | IEEE |
Publisher's address (city only) | Piscataway |
Publication date | 2016-5-27 |
Conference name | 87th ARFTG Microwave Measurement Conference |
Conference date | 27-05-2016 |
Conference place | San Francisco, CA, USA |
ISSN | N/A |
ISBN | 978-1-5090-1308-1 |
Web URL | http://www.arftg.org/ |
Language | English |
Persistent Identifier | IEEE Catalog Number: CFP16ARF-ART |