Impact of measurement uncertainty on modelling
Schreurs D., Liu S., Avolio G., Ocket I.Calibration, Measurement uncertainty, Microwave measurement, nonlinear modelling
Document type | Proceedings |
Journal title / Source | Proc. of 21st International Conference on Microwave, Radar and Wireless Communications (MIKON) |
Peer-reviewed article | 1 |
Volume | n/a |
Issue | n/a |
Page numbers / Article number | 1-4 |
Publisher's name | IEEE |
Publisher's address (city only) | Piscataway |
Publication date | 2016-5-9 |
Conference name | 21st International Conference on Microwave, Radar and Wireless Communications (MIKON) |
Conference date | 9-11 May 2016 |
Conference place | Krakow, Poland |
ISSN | n/a |
DOI | 10.1109/MIKON.2016.7492056 |
ISBN | n/a |
Web URL | http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7492056&isnumber=7491934 |
Language | English |