Impact of measurement uncertainty on modelling
Schreurs D., Liu S., Avolio G., Ocket I.Calibration, Measurement uncertainty, Microwave measurement, nonlinear modelling
| Document type | Proceedings |
| Journal title / Source | Proc. of 21st International Conference on Microwave, Radar and Wireless Communications (MIKON) |
| Peer-reviewed article | 1 |
| Volume | n/a |
| Issue | n/a |
| Page numbers / Article number | 1-4 |
| Publisher's name | IEEE |
| Publisher's address (city only) | Piscataway |
| Publication date | 2016-5-9 |
| Conference name | 21st International Conference on Microwave, Radar and Wireless Communications (MIKON) |
| Conference date | 9-11 May 2016 |
| Conference place | Krakow, Poland |
| ISSN | n/a |
| DOI | 10.1109/MIKON.2016.7492056 |
| ISBN | n/a |
| Web URL | http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7492056&isnumber=7491934 |
| Language | English |