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Impact of measurement uncertainty on modelling

Schreurs D., Liu S., Avolio G., Ocket I.
Keywords:

Calibration, Measurement uncertainty, Microwave measurement, nonlinear modelling

Document type Proceedings
Journal title / Source Proc. of 21st International Conference on Microwave, Radar and Wireless Communications (MIKON)
Peer-reviewed article 1
Volume n/a
Issue n/a
Page numbers / Article number 1-4
Publisher's name IEEE
Publisher's address (city only) Piscataway
Publication date 2016-5-9
Conference name 21st International Conference on Microwave, Radar and Wireless Communications (MIKON)
Conference date 9-11 May 2016
Conference place Krakow, Poland
ISSN n/a
DOI 10.1109/MIKON.2016.7492056
ISBN n/a
Web URL http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7492056&isnumber=7491934
Language English

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Information

Project title (JRP)
SIB62: HFCircuits: Metrology for new electrical measurement quantities in high-frequency circuits
Name of Call / Funding Programme
EMRP A169: Call 2012 SI Broader scope (II)