Single Carrier Trapping and De-trapping in Scaled Silicon Complementary Metal-Oxide-Semiconductor Field-Effect Transistors at Low Temperatures
Li Zuo , Husain Muhammad, Yoshimoto Hiroyuki , Tani Kazuki, Byers James, Sasago Yoshitaka, Hisamoto Digh, Fletcher Jonathan, Kataoka Masaya, Tsuchiya Yoshishige, Saito ShinichiCoulomb blockade, MOSFETs, Carrier Trapping and De-trapping, quantum dots
| Document type | Article |
| Journal title / Source | Semiconductor Science and Technology |
| Publisher's name | IOP Publishing |
| Publication date | 2017-3-24 |
| ISSN | 0268-1242, 1361-6641 |
| DOI | 10.1088/1361-6641/aa6910 |
| Language | English |