Development of a high-accuracy multi-sensor, multi-target coordinate metrology system using frequency scanning interferometry and multilateration

Hughes B., Campbell M. A., Lewis A. J., Lazzarini G. M., Kay N.

Interferometry, large volume metrology, sensors, distance measurement, calibration, traceability

Document type Article
Journal title / Source Proc. SPIE
Volume 10332
Page numbers / Article number 1033202
Publisher's name SPIE
Publication date 2017-6-26
DOI 10.1117/12.2273644
Language English

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