Interlaboratory Comparison of Dielectric Measurements From Microwave to Terahertz Frequencies Using VNA-Based and Optical-Based Methods
Hudlička M., Gäumann G., Kazemipour A., Shang X., Naftaly M., Skinner J., Gregory A., Ausden L., Ridler N., Phung G.N., Arz U., Ulm D., Kleine-Ostmann T., Allal D., Wojciechowski M.Interlaboratory comparison, loss tangent, MCK, material characterization, millimeter-wave measurement, open resonator, permittivity, terahertz measurement, TDS, vector network analyzer (VNA)
| Document type | Article |
| Journal title / Source | IEEE Transactions on Microwave Theory and Techniques |
| Volume | 72 |
| Issue | 11 |
| Page numbers / Article number | 6473-6484 |
| Publisher's name | IEEE |
| Publisher's address (city only) | Piscataway |
| Publication date | 2024-5-22 |
| ISSN | 0018-9480 |
| DOI | 10.5281/zenodo.15064253 |
| Web URL | https://ieeexplore.ieee.org/document/10536177/ |
| Language | English |