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Lumen degradation modeling of white-light LEDs in step stress accelerated degradation test

Huang, Jianlin, Golubović, Dušan S, Yang, Daoguo, Koh, Sau, Li, Xiupeng, Zhang, G.Q. and Fan, Xuejun
Keywords:

Accelerated test, Brownian motion, Degradation test, Light-emitting diodes, Step stress, Wiener process

Document typeArticle
Journal title / SourceReliability Engineering & System Safety
Volume154
Page numbers / Article number152-159
Publisher's nameElsevier BV
Publisher's address (city only)Suite 800, 230 Park Avenue, New York, NY 10169, USA
Publication date 2016-10
ISSN0951-8320
DOI10.1016/j.ress.2016.06.002
LanguageEnglish

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