Lumen degradation modeling of white-light LEDs in step stress accelerated degradation test
Huang Jianlin, Golubović Dušan S, Yang Daoguo, Koh Sau, Li Xiupeng, Zhang G.Q., Fan XuejunAccelerated test, Brownian motion, Degradation test, Light-emitting diodes, Step stress, Wiener process
Document type | Article |
Journal title / Source | Reliability Engineering & System Safety |
Volume | 154 |
Page numbers / Article number | 152-159 |
Publisher's name | Elsevier BV |
Publisher's address (city only) | Suite 800, 230 Park Avenue, New York, NY 10169, USA |
Publication date | 2016-10 |
ISSN | 0951-8320 |
DOI | 10.1016/j.ress.2016.06.002 |
Language | English |