Lumen degradation modeling of white-light LEDs in step stress accelerated degradation test

Huang Jianlin, Golubović Dušan S, Yang Daoguo, Koh Sau, Li Xiupeng, Zhang G.Q., Fan Xuejun

Accelerated test, Brownian motion, Degradation test, Light-emitting diodes, Step stress, Wiener process

Document type Article
Journal title / Source Reliability Engineering & System Safety
Volume 154
Page numbers / Article number 152-159
Publisher's name Elsevier BV
Publisher's address (city only) Suite 800, 230 Park Avenue, New York, NY 10169, USA
Publication date 2016-10
ISSN 0951-8320
DOI 10.1016/j.ress.2016.06.002
Language English

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