Selection and characterization of resistors for a HVDC reference divider
Houtzager E., Rietveldt G., Hällström J., Elg A.-P., van der Beek J. H. N.HVDC, resistors, metrology, voltage coefficient, temperature coefficient, high-voltage techniques, resistance measurement
Document type | Proceedings |
Journal title / Source | Proceedings of the Conference on Precision Electromagnetic Measurements 2012 |
Publisher's name | IEEE |
Publication date | 2012-1 |
Conference name | CPEM 2012 |
Conference date | 01 - 06 July 2012 |
Conference place | Washington DC, USA |