Homogeneity Characterization of Lattice Spacing of Silicon Single Crystals
Waseda A. W., Fujimoto H. F., Zhang X. Z., Kuramoto N. K., Fujii K. F.Avogadro constant, impurity, lattice comparator, lattice spacing, silicon single crystal
| Document type | Article |
| Journal title / Source | IEEE Transaction on Instrumentation and Measurement |
| Peer-reviewed article | 1 |
| Volume | 64 |
| Issue | 6 |
| Page numbers / Article number | 1692-1695 |
| Publisher's name | Institution of Electrical and Electrical Engineering (IEEE) |
| Publisher's address (city only) | Piscataway |
| Publication date | 2015-1-17 |
| ISSN | 0018-9456 |
| DOI | 10.1109/TIM.2014.2383091 |
| Web URL | http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7004030&refinements%3D4294557292%26filter%3DAND%28p_IS_Number%3A7104190%29 |
| Language | English |
| Persistent Identifier | INSPEC Accession Number: 15111465 |