The gateway to Europe's
integrated metrology community.

Homogeneity Characterization of Lattice Spacing of Silicon Single Crystals

Waseda A. W., Fujimoto H. F., Zhang X. Z., Kuramoto N. K., Fujii K. F.
Keywords:

Avogadro constant, impurity, lattice comparator, lattice spacing, silicon single crystal

Document type Article
Journal title / Source IEEE Transaction on Instrumentation and Measurement
Peer-reviewed article 1
Volume 64
Issue 6
Page numbers / Article number 1692-1695
Publisher's name Institution of Electrical and Electrical Engineering (IEEE)
Publisher's address (city only) Piscataway
Publication date 2015-1-17
ISSN 0018-9456
DOI 10.1109/TIM.2014.2383091
Web URL http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7004030&refinements%3D4294557292%26filter%3DAND%28p_IS_Number%3A7104190%29
Language English
Persistent Identifier INSPEC Accession Number: 15111465

Back to the list view

Information

Project title (JRP)
SIB03: kNOW Realisation of the awaited definition of the kilogram - resolving the discrepancies
Name of Call / Funding Programme
EMRP A169: Call 2011 SI Broader Scope