Calibration Algorithm for Nearfield Scanning Microwave Microscopes

Hoffmann J., Wollensack M., Zeier M., Niegemann J., Huber H.-P., Kienberger F.
Document type Proceedings
Journal title / Source Proceedings of the IEEE Nano 2012
Publication date 2013
Conference name IEEE Nano 2012: 12th International Conference on Nanotechnology
Conference date 20 - 23 August 2012
Conference place Birmingham, UK

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