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Analysis of Mesoporous Iridium Oxide Thin Films by the Combined Methodical Approach SEM/EDS/STRATAGem

Sachse, R., Hertwig, A., Kraehnert, R. and Hodoroaba, V.D.
Keywords:

Electron probe microanalysis (EPMA); Iridium oxide; Porous thin films; Spectroscopic ellipsometry

Document typeProceeding
Journal title / SourceProceedings of Microscopy & Microanalysis 2018
Volume24
Page numbers / Article number762-763
Publisher's nameCambridge University Press (CUP)
Publication date 2018-08
Conference nameMicroscopy & Microanalysis 2018
Conference date05-08-2018 to 09-08-2018
Conference placeBaltimore, Maryland, USA
ISSN1431-9276, 1435-8115
DOI10.1017/S1431927618004300
LanguageEnglish

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