High-speed atomic force microscopy for materials science
Payton O.D., Picco L., Scott T.B.Atomic force microscopy, AFM, High-speed AFM, Nanoscale analysis
| Document type | Article |
| Journal title / Source | International Materials Reviews |
| Peer-reviewed article | 1 |
| Volume | 61 |
| Issue | 8 |
| Page numbers / Article number | 473-494 |
| Publisher's name | Taylor & Francis |
| Publisher's address (city only) | London |
| Publication date | 2016-6-14 |
| DOI | 10.1080/09506608.2016.1156301 |
| Web URL | http://www.tandfonline.com/doi/abs/10.1080/09506608.2016.1156301?journalCode=yimr20 |
| Language | English |