HfTi-nanoSQUID gradiometers with high linearity
Bechstein S, Ruede F, Drung D, Storm J. -H., Kieler O. F., Kohlmann J., Weimann T., Schurig T.nanoSQUID gradiometers, metrology
| Document type | Article |
| Journal title / Source | Applied Physics Letters |
| Peer-reviewed article | 1 |
| Volume | 106 |
| Issue | n/a |
| Page numbers / Article number | 072601 |
| Publisher's name | AIP Publishing |
| Publisher's address (city only) | Melville, New York |
| Publication date | 2015-2-17 |
| ISSN | n/a |
| DOI | 10.1063/1.4909523 |
| Web URL | http://scitation.aip.org/content/aip/journal/apl/106/7/10.1063/1.4909523 |
| Language | English |