Ellipsometry‐Based Approach for the Characterization of Mesoporous Thin Films for H Technologies
Hertwig A., Hodoroaba V.Dan, Moor M., Kraehnert R., Sachse R.ellipsometry, thin films, hybrid measurement techniques,
| Document type | Article |
| Journal title / Source | Advanced Engineering Materials |
| Volume | 24 |
| Issue | 6 |
| Page numbers / Article number | 2101320 |
| Publisher's name | Wiley |
| Publisher's address (city only) | Hoboken, NJ, United States |
| Publication date | 2022-3-30 |
| ISSN | 1438-1656, 1527-2648 |
| DOI | 10.1002/adem.202101320 |
| Web URL | https://doi.org/10.1002/adem.202101320 |
| Language | English |