Mutual interference in calibration line configurations
Schmuckle F.J., Probst T., Arz U., Phung G.N., Doerner R. , Heinrich W.Coupling, em simulation, measurements, parasitic modes, probes
| Document type | Article |
| Journal title / Source | 2017 89th ARFTG Microwave Measurement Conference (ARFTG) |
| Publisher's name | IEEE |
| Publication date | 2017-6 |
| DOI | 10.1109/ARFTG.2017.8000823 |
| Web URL | https://www.fbh-berlin.com/publications-patents/publications/title/mutual-interference-in-calibration-line-configurations |
| Language | English |