In situ scanning gate imaging of individual quantum two-level system defects in live superconducting circuits
Hegedüs M., Banerjee R., Hutcheson A., Barker T., Mahashabde S., Danilov A., Kubatkin S., Antonov V., de Graaf S.TLS, superconducting circuits, decoherence, scanning gate microscopy
| Document type | Article |
| Journal title / Source | Science Advances |
| Volume | 11 |
| Issue | 18 |
| Publisher's name | American Association for the Advancement of Science (AAAS) |
| Publisher's address (city only) | Washington, DC, United States |
| Publication date | 2025-1-1 |
| DOI | 10.1126/sciadv.adt8586 |