Direct Sampling in Multi-channel Synchronous TDEMI Measurements
Hartman T., Moonen N., Leferink F.-
| Document type | Proceedings |
| Journal title / Source | 2018 IEEE 4th Global Electromagnetic Compatibility Conference (GEMCCON) |
| Publisher's name | IEEE |
| Publication date | 2018-11 |
| Conference name | 2018 IEEE 4th Global Electromagnetic Compatibility Conference (GEMCCON) |
| Conference date | 07-11-2018 to 09-11-2018 |
| Conference place | Stellenbosch, South Africa |
| DOI | 10.1109/GEMCCON.2018.8628576 |
| Web URL | https://research.utwente.nl/en/publications/direct-sampling-in-multi-channel-synchronous-tdemi-measurements |
| Language | English |