The gateway to Europe's
integrated metrology community.

Phonon‐Enhanced Near‐Field Spectroscopy to Extract the Local Electronic Properties of Buried 2D Electron Systems in Oxide Heterostructures

Gunkel F., Dittmann R., Hoehl A. (DPM), Lewin M., Kästner B., Rose M‐A., Ulrich G. (BEV), Barnett J., Taubner T.

2D electron systems, electronic properties, LaAlO/SrTiO, near-field spectroscopy, oxide heterostructure

Document type Article
Journal title / Source Advanced Functional Materials
Volume 30
Issue 46
Page numbers / Article number 2004767
Publisher's name Wiley
Publication date 2020-9
ISSN 1616-301X, 1616-3028
DOI 10.1002/adfm.202004767
Language English

Back to the list view


Project title (JRP)
16ENG06: ADVENT: Metrology for advanced energy-saving technology in next-generation electronics applications
Name of Call / Funding Programme
EMPIR 2016: Energy