Metrology Challenges in Quantum Key Distribution

Gui Y., Unnikrishnan D., Stanley M., Fatadin I.

The metrology of the QKD devices and systems, QKD metrology in both fibre based QKD and free space QKD systems, application, traceable calibration methods, and practical device characterising technologies

Document type Article
Journal title / Source Journal of Physics: Conference Series
Volume 2416
Issue 1
Page numbers / Article number 012005
Publisher's name IOP Publishing
Publication date 2022-12
ISSN 1742-6588, 1742-6596
DOI 10.1088/1742-6596/2416/1/012005
Language English

Back to the list view