Metrology Challenges in Quantum Key Distribution
Gui Y., Unnikrishnan D., Stanley M., Fatadin I.The metrology of the QKD devices and systems, QKD metrology in both fibre based QKD and free space QKD systems, application, traceable calibration methods, and practical device characterising technologies
| Document type | Article |
| Journal title / Source | Journal of Physics: Conference Series |
| Volume | 2416 |
| Issue | 1 |
| Page numbers / Article number | 012005 |
| Publisher's name | IOP Publishing |
| Publication date | 2022-12 |
| ISSN | 1742-6588, 1742-6596 |
| DOI | 10.1088/1742-6596/2416/1/012005 |
| Web URL | https://iopscience.iop.org/journal/1742-6596 |
| Language | English |