Grazing-incidence x-ray fluorescence analysis for non-destructive determination of In and Ga depth profiles in Cu(In,Ga)Se2 absorber films

Streeck CS, Brunken SB, Gerlach MG, Herzog CHB, Hönicke PH, Kaufmann CAK, Lubeck JL, Malzer WM, Pollakowski BP, Unterumsberger RU, Weber AW, Beckhoff BB, Kanngießer BK, Schock HWS, Mainz RM

Fluorescence, copper, synchrotron radiation, x-ray fluorescence spectroscopy, solar cells

Document type Article
Journal title / Source Applied Physics Letters
Peer-reviewed article 1
Volume 103
Issue 11
Page numbers / Article number 1-12
Publisher's name AIP Publishing
Publisher's address (city only) New York
Publication date 2013-9-12
ISSN 0003-6951
DOI 10.1063/1.4821267
Language English

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