Graphene metrology
Janssen T.J.B.M., Giusca C., Gallop J., Hao L., Kazakova O., Panchal V., Pierce R., Tzalenchuk A.C,Conductivity,Graphene,Metrology,Microwave measurement,Resistance,Silicon carbide,Substrates,electrical conductivity measurement,functional property,graphene,graphene metrology,graphene morphology,graphene topography,industrial production,joining processes,linking morphology,measurement standards,microwave materials,microwave measurement,noncontact microwave conductivity measurement,quality control,quantum Hall effect,rapid noninvasive quality control
| Document type | Proceedings |
| Journal title / Source | 29th Conference on Precision Electromagnetic Measurements (CPEM 2014) |
| Page numbers / Article number | 662-663 |
| Publisher's name | IEEE |
| Publication date | 2014-8 |
| ISSN | 0589-1485 |
| DOI | 10.1109/CPEM.2014.6898559 |
| ISBN | 978-1-4799-2479-0 |
| Web URL | http://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=6898559 |
| Language | English |