Graphene metrology

Janssen T.J.B.M., Giusca C., Gallop J., Hao L., Kazakova O., Panchal V., Pierce R., Tzalenchuk A.

C,Conductivity,Graphene,Metrology,Microwave measurement,Resistance,Silicon carbide,Substrates,electrical conductivity measurement,functional property,graphene,graphene metrology,graphene morphology,graphene topography,industrial production,joining processes,linking morphology,measurement standards,microwave materials,microwave measurement,noncontact microwave conductivity measurement,quality control,quantum Hall effect,rapid noninvasive quality control

Document type Proceedings
Journal title / Source 29th Conference on Precision Electromagnetic Measurements (CPEM 2014)
Page numbers / Article number 662-663
Publisher's name IEEE
Publication date 2014-8
ISSN 0589-1485
DOI 10.1109/CPEM.2014.6898559
ISBN 978-1-4799-2479-0
Language English

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