Utilising Digital Light Processing and Compressed Sensing for Photocurrent Mapping of Encapsulated Photovoltaic Modules
Gottschalg R., Betts T., Bliss M. , Koutsourakis G.Non-Destructive Testing, PV Modules, Compressed Sensing, Current Mapping
Document type | Proceedings |
Journal title / Source | Proceedings of EUPVSEC |
Publication date | 2018 |
Conference name | 35th European Photovoltaic Solar Energy Conference and Exhibition |
Conference date | 24-09-2018 to 27-09-2018 |
Conference place | Brussels |
DOI | 10.4229/35thEUPVSEC20182018-5BO.11.6 |
ISBN | 3-936338-50-7 |
Web URL | https://www.eupvsec-proceedings.com/proceedings?paper=44865 |
Language | English |