Utilising Digital Light Processing and Compressed Sensing for Photocurrent Mapping of Encapsulated Photovoltaic Modules

Gottschalg R., Betts T., Bliss M. , Koutsourakis G.
Keywords:

Non-Destructive Testing, PV Modules, Compressed Sensing, Current Mapping

Document type Proceedings
Journal title / Source Proceedings of EUPVSEC
Publication date 2018
Conference name 35th European Photovoltaic Solar Energy Conference and Exhibition
Conference date 24-09-2018 to 27-09-2018
Conference place Brussels
DOI 10.4229/35thEUPVSEC20182018-5BO.11.6
ISBN 3-936338-50-7
Web URL https://www.eupvsec-proceedings.com/proceedings?paper=44865
Language English

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