Influence of patient head definition on induced E‐fields during MR examination

Goren T., Reboux S., Farcito S., Lloyd B., Kuster N.
Keywords:

head IEC 60601-2-33 implant testing ISO 10974 MR safety numerical simulation RF exposure RF-induced heating

Document type Article
Journal title / Source Magnetic Resonance in Medicine
Volume 91
Issue 2
Page numbers / Article number 735-740
Publisher's name Wiley
Publisher's address (city only) Hoboken, NJ, United States
Publication date 2023-10-17
ISSN 0740-3194, 1522-2594
DOI 10.1002/mrm.29894
Web URL http://doi.org/10.1002/mrm.29894
Language English

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