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Characterizing Voltage Transformers up to 150 kHz: A New Approach to Generate MV Distorted Test Waveforms

Giordano D., Crotti G., D’Avanzo G., Delle Femine A., Iodice C., Luiso M., Letizia P.S.
Keywords:

Instrument Transformers, Power Quality, high-frequency harmonics, metrological traceability

Document type Proceedings
Journal title / Source 2024 Conference on Precision Electromagnetic Measurements (CPEM)
Page numbers / Article number 1-2
Publisher's name IEEE
Publisher's address (city only) Piscataway, NJ, United States
Publication date 2024-7
Conference name 2024 Conference on Precision Electromagnetic Measurements (CPEM)
Conference date 08-07-2024 to 12-07-2024
Conference place Denver, CO, USA
DOI 10.5281/zenodo.14355976
Language English

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Information

Name of Call / Funding Programme
Metrology Partnership 2022: Normative