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Further Investigations into Connection Repeatability of Waveguide Devices at Frequencies from 750 GHz to 1.1 THz

Ridler N. M., Clarke R. G.
Keywords:

Measurement repeatability, Measurement standards, VNA calibration, Submillimeter-wave measurements, Measurement uncertainty

Document type Proceedings
Journal title / Source 83rd ARFTG Microwave Measurement Conference (ARFTG)
Peer-reviewed article 1
Volume N/A
Issue N/A
Page numbers / Article number N/A
Publisher's name Institute of Electrical and Electronics Engineers (IEEE)
Publisher's address (city only) New York, USA
Publication date 2014-6-6
Conference name 83rd ARFTG Microwave Measurement Conference (ARFTG)
Conference date 06-06-2014 to 06-06-2014
Conference place Tampa, Florida, USA
ISSN N/A
DOI 10.1109/ARFTG.2014.6899521
ISBN N/A
Web URL http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=6899521
Language English

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Information

Project title (JRP)
SIB62: HFCircuits: Metrology for new electrical measurement quantities in high-frequency circuits
Name of Call / Funding Programme
EMRP A169: Call 2012 SI Broader scope (II)