Further Investigations into Connection Repeatability of Waveguide Devices at Frequencies from 750 GHz to 1.1 THz
Ridler N. M., Clarke R. G.Measurement repeatability, Measurement standards, VNA calibration, Submillimeter-wave measurements, Measurement uncertainty
Document type | Proceedings |
Journal title / Source | 83rd ARFTG Microwave Measurement Conference (ARFTG) |
Peer-reviewed article | 1 |
Volume | N/A |
Issue | N/A |
Page numbers / Article number | N/A |
Publisher's name | Institute of Electrical and Electronics Engineers (IEEE) |
Publisher's address (city only) | New York, USA |
Publication date | 2014-6-6 |
Conference name | 83rd ARFTG Microwave Measurement Conference (ARFTG) |
Conference date | 06-06-2014 to 06-06-2014 |
Conference place | Tampa, Florida, USA |
ISSN | N/A |
DOI | 10.1109/ARFTG.2014.6899521 |
ISBN | N/A |
Web URL | http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=6899521 |
Language | English |